Pulsed capacitance technique for evaluation of barrier st...
Gaubas, Eugenijus / Ceponis, Tomas / Vaitkus, Juozas-Vidmantis
Traditional semiconductor device characterization techniques based on capacitance measurements using a small test signal, the different modifications of deep level transient spectroscopy etc. are limited if devices contain a large density of deep traps, exhibiting enhanced generation currents. In this book, a pulsed capacitance technique for barrier evaluation by linearly increasing voltage (BELIV) is presented. The basics of analysis of the c...