Testing for Small-Delay Defects in Nanoscale CMOS Integra...
Goel, Sandeep K. / Chakrabarty, Krishnendu
Advances in design methods and process technologies are causing a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. This book covers common problems in areas such as process variation, power supply, noise, crosstalk, resistive opens/bridges, and design-for-manuf...
