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Principles of Electron Optics, Volume 3

Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America, member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) / Kasper, Erwin (Institute of Applied Physics, University of Tuebingen, Tuebingen, Germany)
Principles of Electron Optics, Volume 3
Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on ...

CHF 309.00

Principles of Electron Optics, Volume 2

Hawkes, Peter W. (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France) / Kasper, Erwin (Institute of Applied Physics, University of Tuebingen, Tuebingen, Germany)
Principles of Electron Optics, Volume 2
Principles of Electron Optics: Applied Geometrical Optics, Second Edition gives detailed information about the many optical elements that use the theory presented in Volume 1: electrostatic and magnetic lenses, quadrupoles, cathode-lens-based instruments including the new ultrafast microscopes, low-energy-electron microscopes and photoemission electron microscopes and the mirrors found in their systems, Wien filters and deflectors. The chapter...

CHF 292.00

Principles of Electron Optics, Volume 1

Hawkes, Peter W / Kasper, Erwin
Principles of Electron Optics, Volume 1
Volume one of Principles of Electron Optics: Basic Geometrical Optics, Second Edition, explores the geometrical optics needed to analyze an extremely wide range of instruments: cathode-ray tubes, the family of electron microscopes, including the fixed-beam and scanning transmission instruments, the scanning electron microscope and the emission microscope, electron spectrometers and mass spectrograph, image converters, electron interferometers ...

CHF 250.00