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The Properties of Ponderomotive Lenses

Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America, member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) / Hytch, Martin (Senior Scientist, French National Centre for Research (CNRS), Toulouse, France)
The Properties of Ponderomotive Lenses
The Properties of Ponderomotive Lenses, Volume 228 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the dev...

CHF 269.00

Aberration Theory in Electron and Ion Optics

Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America, member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) / Hytch, Martin (Senior Scientist, French National Centre for Research (CNRS), Toulouse, France)
Aberration Theory in Electron and Ion Optics
Advances in Imaging and Electron Physics, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromag...

CHF 269.00

Coherent Electron Microscopy: Designing faster and bright...

Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America, member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) / Hytch, Martin (Senior Scientist, French National Centre for Research (CNRS), Toulouse, France)
Coherent Electron Microscopy: Designing faster and brighter electron sources
Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, ...

CHF 269.00