Statistical Modeling for Computer-Aided Design of Mos VLS...
Ismail, Mohammed / Michael, Christopher![Statistical Modeling for Computer-Aided Design of Mos VLSI Circuits](https://support.digitalhusky.com/media/annotations/sorted/152/15214894/CHSBZCOP0315214894.jpg)
As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits describes a statistical circuit simulation and optimization environment for VLSI circuit designers. The first s...