Particle-Induced X-Ray Emission Spectrometry (Pixe)
Johansson, Sven A E / Campbell, John L / Malmqvist, Klas G / Winefordner, James D
Long proven as an analytical tool of uncommon accuracy and utility, particle-induced X-ray emission has enjoyed a solid, if narrow, reputation in the area of chemical analysis. Capable of detecting elemental concentrations down to parts per million, PIXE is now a standard component of the analytical arsenal of the nuclear physics laboratory. Yet in wider avenues of chemical research, PIXE technology is still relatively new and untested. An ins...