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Physical Analytics in Materials Science

Krecar, Dragan
Physical Analytics in Materials Science
Nowadays the application of physical analytic methods in the materials science (synthesis, characterisation and development of new materials) is essential. In this work four of these techniques, which are able to investigate surfaces and interfaces as well as the bulk material: secondary ion mass spectrometry (SIMS), Rutherford backscattering (RBS), electron microscopy (SEM, TEM) and Auger electron spectroscopy (AES) are applied on four differ...

CHF 102.00