Terrestrial Neutron-Induced Soft Errors in Advanced Memor...
Nakamura, Takashi / Ibe, Eishi / Baba, Mamoru / Yahagi, Yasuo / Kameyama, Hideaki
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the r...