Elements of Electromigration
Tu, King-Ning / Liu, Yingxia![Elements of Electromigration](https://support.digitalhusky.com/media/annotations/sorted/448/44862011/CHSBZCOP0344862011.jpg)
In this invaluable resource for graduate students and practicing professionals, Tu and Liu provide a comprehensive account of electromigration and give a practical guide on how to manage its effects in microelectronic devices, especially newer devices that make use of 3D architectures.