Recent Advances in Metrology
Yadav, Sanjay / Chaudhary, K. P. / Garg, Naveen / Arya, Yogendra / Dahiya, Aman / Gahlot, Ajay
This book presents the select proceedings of the 7th National Conference on Advances in Metrology (AdMet 2021) organized by Maharaja Surajmal Institute of Technology, New Delhi, India. The main theme of the conference was "Sensors and Advance Materials for Measurement and Quality Improvement". The book highlights and discusses the technological developments in the areas of sensor technology, measurement, advance material for industrial applica...
