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Advanced Materials Characterization

Kumar, Ch Sateesh / Singh, M. Muralidhar / KRISHNA, RAM

Advanced Materials Characterization

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

CHF 166.00

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ISBN 9781032375106
Sprache eng
Cover Fester Einband
Verlag Taylor and Francis
Jahr 20230504

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