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An Approach to mitigate Single Event Latch Up and Soft Errors

Dubey, Amarish

An Approach to mitigate Single Event Latch Up and Soft Errors

Single Effect is a big challenge for VLSI Industries. All kind of Aircraft are suffering with this issue. So A excellent mitigation scheme is required to withstand with this issue. Keeping this issue in the mind, this book has been written. The book started with the semiconductor memories description then radiation effects and step by step to mitigation schemes. The mitigation schemes with effect at different parameters is also given with comparison so that a researcher can easily take reference and move for further research. This book is written in very easy and interesting language so that even a beginner can understand easily

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ISBN 9783659246685
Sprache eng
Cover Kartonierter Einband (Kt)
Verlag LAP Lambert Academic Publishing
Jahr 20121006

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