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Atom Probe Field Ion Microscopy

A definitive account of the theory, practice, and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. New applications for this technique are rapidly emerging and graduate level material and surface scientists will enjoy this account of the state-of-the-art.

CHF 220.00

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ISBN 9780198513872
Sprache eng
Cover Fester Einband
Verlag Oxford Academic
Jahr 19960919

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