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Designer's Guide to Testable ASIC Devices

Needham, Wayne M

Designer's Guide to Testable ASIC Devices

While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact o

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ISBN 9780442002213
Sprache eng
Cover Fester Einband
Verlag Springer Nature
Jahr 19910110

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