Electromigration in Thin Films and Electronic Devices

Kim, Choong-Un (University of Texas at Arlington, USA)

Electromigration in Thin Films and Electronic Devices

Electromigration in Thin Films and Electronic Devices

Kim, Choong-Un (University of Texas at Arlington, USA)

CHF 279.00

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ISBN	9780081016961
Sprache	eng
Cover	Kartonierter Einband (Kt)
Verlag	Elsevier Science & Technology
Jahr	20160819

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