Helps to improve fundamentals and applications of various modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. This title intends to promote the measurement of samples while reducing the scattered background in the x-ray spectrum.
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ISBN | 9780824706005 |
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Sprache | eng |
Cover | Fester Einband |
Verlag | Taylor and Francis |
Jahr | 20011127 |
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