This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.
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| ISBN | 9783540418184 |
|---|---|
| Sprache | eng |
| Cover | B, Surfaces and Interfaces, Thin Films, Solid State Physics, Spectroscopy and Microscopy, Characterization and Evaluation of Materials, Physical Chemistry, Surfaces, Interfaces and Thin Film, Electronic Devices, spectroscopy, Characterization and Analytical Technique, Chemistry and Materials Science, Materials—Surfaces, Thin films, Microscopy, Materials science, Surface chemistry & adsorption, Spectrum analysis, spectrochemistry, mass spectrometry, Scientific equipment, experiments & techniques, Testing of materials, Fester Einband |
| Verlag | Springer Nature EN |
| Jahr | 2002 |
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