This book addresses the study of process and design variables to determine the ease and feasibility of fabrication -- or manufacturability -- of contemporary VLSI systems and circuits. The reader will be introduced to the key aspects in today's design practices: yield management, defect and fault modeling, testing, and fault tolerant architectures. These four sections present the reader with practical issues normally applied in industry and usually required by quality, product, and design engineering departments. "Integrated Circuit Manufacturability" thoroughly examines the entire manufacturing process from circuit to silicon.