Features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
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ISBN | 9781615038268 |
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Sprache | eng |
Cover | Kartonierter Einband (Kt) |
Verlag | ASM International |
Jahr | 2011 |
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