Materials Reliability Issues in Microelectronics: Volume 225

Lloyd, James R. / Yost, Frederick G. / Ho, Paul S.

Materials Reliability Issues in Microelectronics: Volume 225

Materials Reliability Issues in Microelectronics: Volume 225

Lloyd, James R. / Yost, Frederick G. / Ho, Paul S.

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

CHF 52.50

Lieferbar

ISBN	9781558991194
Sprache	eng
Cover	Fester Einband
Verlag	Cambridge
Jahr	199110

Kundenbewertungen

Dieser Artikel hat noch keine Bewertungen.

.lang-group, .lang-btn { display: inline-block !important; } .lang-list {display: none;}