Reliability and Failure of Electronic Materials and Devices

Ohring, Milton (Stevens Institute of Technology, Hoboken, NJ, USA (Retired)) / Kasprzak, Lucian (Siemens Healthcare Diagnostics (Retired))

Reliability and Failure of Electronic Materials and Devices

Reliability and Failure of Electronic Materials and Devices

Reliability and Failure of Electronic Materials and Devices

Reliability and Failure of Electronic Materials and Devices

Reliability and Failure of Electronic Materials and Devices

Ohring, Milton (Stevens Institute of Technology, Hoboken, NJ, USA (Retired)) / Kasprzak, Lucian (Siemens Healthcare Diagnostics (Retired))

CHF 175.00

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ISBN	9780120885749
Sprache	eng
Cover	Fester Einband
Verlag	Elsevier Science Publishing Co Inc
Jahr	20141023

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.lang-group, .lang-btn { display: inline-block !important; } .lang-list {display: none;}